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[IEEE 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers - Hsinchu, Taiwan (6-8 Oct. 2003)] 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) - A new approach to model the I∼V characteristics for nanoscale MOSFETs

✍ Scribed by Pattanaik, M.; Banerjee, S.

Book ID: 121868109
Publisher: IEEE
Year: 2003
Weight: 306 KB
Category: Article
ISBN-13: 9780780377653
DOI: 10.1109/VTSA.2003.1252604

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