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[IEEE 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers - Hsinchu, Taiwan (6-8 Oct. 2003)] 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) - Leakage in nanometer scale CMOS circuits

✍ Scribed by Mukhopadhyay, S.; Mahmoodi-Meimand, H.; Neau, C.; Roy, K.

Book ID: 120812348
Publisher: IEEE
Year: 2003
Weight: 427 KB
Category: Article
ISBN-13: 9780780377653
DOI: 10.1109/VTSA.2003.1252615

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