𝔖 Bobbio Scriptorium

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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Pin-joint design effect on the reliability of a polysilicon microengine

✍ Scribed by Tanner, D.M.; Walraven, J.A.; Mani, S.S.; Swanson, S.E.

Book ID: 126706734
Publisher: IEEE
Year: 2002
Weight: 747 KB
Category: Article
ISBN-13: 9780780373525
DOI: 10.1109/RELPHY.2002.996623

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