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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - An analysis of the partial discharge pattern related to the artificial defects introduced at the interface in XLPE cable joint using laboratory model

✍ Scribed by Lee, J.S.; Koo, J.Y.; Lim, Y.S.; Kim, J.T.; Lee, S.K.

Book ID: 118019553
Publisher: IEEE
Year: 2002
Weight: 270 KB
Volume: 0
Category: Article
ISBN-13: 9780780375024
DOI: 10.1109/ceidp.2002.1048839

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