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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - The influence of survival mechanical stress and voltage frequency on electrical tree in XLPE

✍ Scribed by Zheng, X.; Chen, G.; Davies, A.E.; Sutton, S.J.; Swingler, S.G.

Book ID: 115507998
Publisher: IEEE
Year: 2002
Weight: 329 KB
Volume: 0
Category: Article
ISBN-13: 9780780375024
DOI: 10.1109/ceidp.2002.1048955

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