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[IEEE 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena - Cancun, Mexico (20-24 Oct. 2002)] Annual Report Conference on Electrical Insulation and Dielectric Phenomena - The effect of the process parameters on the electrical properties of Ni-Cr-Si alloy thin resistor films

✍ Scribed by Boong-joo Lee, ; Gu-bum Park, ; Jong-il Kim, ; Duck-chool Lee,

Book ID: 115517888
Publisher: IEEE
Year: 2002
Weight: 169 KB
Volume: 0
Category: Article
ISBN-13: 9780780375024
DOI: 10.1109/ceidp.2002.1048739

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