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[IEEE 2002 IEEE AUTOTESTCON. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' - Huntsville, AL, USA (Oct. 2002)] Proceedings, IEEE AUTOTESTCON - Draft standard for test industry metadata (TIM)

✍ Scribed by Powell, R.; Roffman, G.

Book ID: 126767286
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 410 KB
Category: Article
ISBN-13: 9780780374416
DOI: 10.1109/AUTEST.2002.1047912

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