[IEEE 2002 IEEE AUTOTESTCON. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' - Huntsville, AL, USA (Oct. 2002)] Proceedings, IEEE AUTOTESTCON - Factory automation systems: Evolution and trends

✍ Scribed by Wang, L.

• Book ID: 111880591
• Publisher: IEEE
• Year: 2002
• Tongue: English
• Weight: 352 KB
• Volume: 0
• Category: Article
• ISBN-13: 9780780374416
• DOI: 10.1109/autest.2002.1047967