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[IEEE 2002 IEEE AUTOTESTCON. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' - Huntsville, AL, USA (Oct. 2002)] Proceedings, IEEE AUTOTESTCON - Using logical decision in DFT method selection

✍ Scribed by Hyun-Moo Kim, ; Ambler, T.

Book ID: 126740763
Publisher: IEEE
Year: 2002
Weight: 207 KB
Category: Article
ISBN-13: 9780780374416
DOI: 10.1109/AUTEST.2002.1047945

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