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[IEEE 2002 IEEE AUTOTESTCON. Systems Readiness Technology Conference. 'The New Millennium Challenge - Transforming Test' - Huntsville, AL, USA (Oct. 2002)] Proceedings, IEEE AUTOTESTCON - Overview and applications of the IEEE P1451.4 smart sensor interface standard

✍ Scribed by Potter, D.

Book ID: 126712978
Publisher: IEEE
Year: 2002
Weight: 455 KB
Category: Article
ISBN-13: 9780780374416
DOI: 10.1109/AUTEST.2002.1047959

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