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[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - Extraction of the bulk-charge effect parameter in MOSFETs

✍ Scribed by Garcia Sanchez, F.J.; Ortiz-Conde, A.; Salcedo, J.A.; Liou, J.J.; Yue, Y.

Book ID: 120084627
Publisher: IEEE
Year: 1999
Tongue: English
Weight: 237 KB
Edition: 2000
Volume: 1
Category: Article
ISBN-13: 9780780352353
DOI: 10.1109/ICMEL.2000.840539

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