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[IEEE 2000 22nd International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 May 2000)] 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) - The experimental study on the temperature characteristics of the BRT and the EST

✍ Scribed by Byung-Chul Jeon, ; Dae-Seok Byeon, ; Jae-Keun Oh, ; Min-Koo Han, ; Yearn-Ik Choi,

Book ID: 111863094
Publisher: IEEE
Year: 1999
Weight: 225 KB
Volume: 2
Category: Article
ISBN-13: 9780780352353
DOI: 10.1109/icmel.2000.838773

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