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[IEEE 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 - Fontevraud, France (13-17 Sept. 1999)] 1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) - Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electrons or X-ray irradiation

โœ Scribed by Ceschia, M.; Paccagnella, A.; Sandrin, S.; Ghidini, G.; Wyss, J.; Lavale, M.; Flament, O.


Book ID
125848327
Publisher
IEEE
Year
2000
Weight
769 KB
Edition
1999
Category
Article
ISBN-13
9780780357266

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