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[IEEE 1998 IEEE International SOI Conference Proceedings - Stuart, FL, USA (5-8 Oct. 1998)] 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) - Mechanism of electron capture and its effect on trapped holes at oxygen-deficient centers in buried oxide

✍ Scribed by Karna, S.P.; Pugh, R.D.; Chavez, J.R.; Shedd, W.; Brothers, C.P.; Singaraju, B.K.

No coin nor oath required. For personal study only.

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