✦ LIBER ✦

[IEEE 1998 IEEE International SOI Conference Proceedings - Stuart, FL, USA (5-8 Oct. 1998)] 1998 IEEE International SOI Conference Proceedings (Cat No.98CH36199) - Edge effects characterization in gate-all-around SOI MOSFETs

✍ Scribed by Vandooren, A.; Flandre, D.; Cristoloveanu, S.; Colinge, J.-P.

No coin nor oath required. For personal study only.

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