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[IEEE 1997 IEEE International SOI Conference Proceedings - Fish Camp, CA, USA (6-9 Oct. 1997)] 1997 IEEE International SOI Conference Proceedings - Characterisation of geometry dependence of SOI MOSFET thermal resistance and capacitance parameters

✍ Scribed by Tenbroek, B.M.; Redman-White, W.; Lee, M.S.L.; Bunyan, R.J.T.; Uren, M.J.

No coin nor oath required. For personal study only.

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