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[IEEE 1997 IEEE International SOI Conference Proceedings - Fish Camp, CA, USA (6-9 Oct. 1997)] 1997 IEEE International SOI Conference Proceedings - SOI materials defect characterization

✍ Scribed by Pham, D.T.; Bich-Yen Nguyen, ; O'Meara, D.; Wang, V.; Nguyen, N.; Smith, J.; Veteran, J.; Mendicino, M.; Campbell, A.

Book ID: 126665277
Publisher: IEEE
Year: 1997
Weight: 378 KB
Category: Article
ISBN-13: 9780780339385
DOI: 10.1109/SOI.1997.634974

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