𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Reliability of high aspect ratio plated through holes (PTH) for advanced printed circuit board (PCB) packages

✍ Scribed by Goval, D.; Azimi, H.; Kim Poh Chong, ; Mirng-Ji Lii,

Book ID: 125421714
Publisher: IEEE
Year: 1997
Weight: 806 KB
Category: Article
ISBN-13: 9780780335752
DOI: 10.1109/relphy.1997.584249

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Short-timescale thermal mapping of interconnects

✍ Yongho Sungtaek Ju, ; Goodson, K.E. 📂 Article 📅 1997 🏛 IEEE ⚖ 643 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Temperature cycling and thermal shock failure rate modeling

✍ Blish, R.C. 📂 Article 📅 1997 🏛 IEEE ⚖ 889 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Towards a nondestructive procedure for characterization of molding compounds

✍ Canumalla, S.; Kessler, L.W. 📂 Article 📅 1997 🏛 IEEE ⚖ 630 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Accelerated gate-oxide breakdown in mixed-voltage I/O circuits

✍ Furukawa, T.; Turner, D.; Mittl, S.; Maloney, M.; Serafin, R.; Clark, W.; Bialas 📂 Article 📅 1997 🏛 IEEE ⚖ 520 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Emerging role of semiconductor process equipment to overcome device failure mechanisms

✍ Sinha, A.K.; Moghadam, F.; Mosley, R.; Chang, M.; Ellwanger, R. 📂 Article 📅 1997 🏛 IEEE ⚖ 948 KB

[IEEE 1997 IEEE International Reliabilit

[IEEE 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Denver, CO, USA (8-10 April 1997)] 1997 IEEE International Reliability Physics Symposium Proceedings. 35th Annual - Focused-ion-beam-induced insulator deposition at decreased beam current density

✍ Abramo, M.; Adams, E.; Gibson, M.; Hahn, L.; Doyle, A. 📂 Article 📅 1997 🏛 IEEE ⚖ 578 KB