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[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Optical, electrical and structural properties of AlN thin films

✍ Scribed by Morosanu, C.; Stoica, T.A.; Stoica, T.F.; Necsoiu, D.; Popescu, M.

Book ID: 120573588
Publisher: IEEE
Year: 1995
Weight: 364 KB
Category: Article
ISBN-13: 9780780326477
DOI: 10.1109/SMICND.1995.494893

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