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[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - A radiation induced failure mechanism for power semiconductor devices

✍ Scribed by Obreja, V.V.N.

Book ID: 111859019
Publisher: IEEE
Year: 1995
Weight: 303 KB
Volume: 0
Category: Article
ISBN-13: 9780780326477
DOI: 10.1109/smicnd.1995.494900

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