𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - How to avoid TRAPATT oscillations at the reverse-recovery of power diodes

✍ Scribed by Kaschani, K.T.; Sittig, R.

Book ID: 120045288
Publisher: IEEE
Year: 1995
Weight: 503 KB
Category: Article
ISBN-13: 9780780326477
DOI: 10.1109/SMICND.1995.495081

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1995 International Semiconductor C

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - A radiation induced failure mechanism for power semiconductor devices

✍ Obreja, V.V.N. 📂 Article 📅 1995 🏛 IEEE ⚖ 303 KB

[IEEE 1995 International Semiconductor C

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Optimal extraction-a generalized least-squares approach

✍ Tudor, B.; Steriu, M.-D. 📂 Article 📅 1995 🏛 IEEE ⚖ 407 KB

[IEEE 1995 International Semiconductor C

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Modelling and performance of vertical trench MOSFET in power electronics

✍ Morancho, F.; Tranduc, H.; Rossel, P.; Charitat, G. 📂 Article 📅 1995 🏛 IEEE ⚖ 476 KB

[IEEE 1995 International Semiconductor C

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Optical, electrical and structural properties of AlN thin films

✍ Morosanu, C.; Stoica, T.A.; Stoica, T.F.; Necsoiu, D.; Popescu, M. 📂 Article 📅 1995 🏛 IEEE ⚖ 364 KB

[IEEE 1995 International Semiconductor C

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Static and noise characterization of deep submicron CMOS devices

✍ Zimmermann, J.; Ghibaudo, G. 📂 Article 📅 1995 🏛 IEEE ⚖ 670 KB

[IEEE 1995 International Semiconductor C

[IEEE 1995 International Semiconductor Conference. CAS '95 - Sinaia, Romania (11-14 Oct. 1995)] 1995 International Semiconductor Conference. CAS '95 Proceedings - Defect engineering investigation with cathodoluminescence in scanning electron microscopy

✍ Nazarov, M.V.; Nazarova, T.A. 📂 Article 📅 1995 🏛 IEEE ⚖ 295 KB