𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - San Jose, CA, USA (7-9 Feb. 1995)] Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Methodology for thermal evaluation of multichip modules

✍ Scribed by Lall, B.S.; Guenin, B.M.; Molnar, R.J.

Book ID: 126713950
Publisher: IEEE
Year: 1995
Weight: 714 KB
Category: Article
ISBN-13: 9780780324343
DOI: 10.1109/STHERM.1995.512054

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1995 IEEE/CPMT 11th Semiconductor

[IEEE 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - San Jose, CA, USA (7-9 Feb. 1995)] Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Optimum design and selection of heat sinks

✍ Lee, S. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 665 KB

[IEEE 1995 IEEE/CPMT 11th Semiconductor

[IEEE 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - San Jose, CA, USA (7-9 Feb. 1995)] Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - A method of the BJT transient thermal impedance measurement with double junction calibration

✍ Zarebski, J.; Gorecki, K. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 229 KB

[IEEE 1994 IEEE/CHMT 10th Semiconductor

[IEEE 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - San Jose, CA, USA (1-3 Feb. 1994)] Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Thermal management of silicon-based multichip modules

✍ Mok, L.S. 📂 Article 📅 1994 🏛 IEEE ⚖ 374 KB

[IEEE 2012 IEEE/CPMT 28th Semiconductor

[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Modeling of fan failures in networking enclosures

✍ Narasimhan, Susheela; Shankaran, Gokul; Basak, Shankar 📂 Article 📅 2012 🏛 IEEE ⚖ 891 KB

[IEEE 2012 IEEE/CPMT 28th Semiconductor

[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Sustainable data centers powered by renewable energy

✍ Klein, Levente J.; Bermudez, Sergio; Wehle, Hans-Dieter; Barabasi, Stephan; Hama 📂 Article 📅 2012 🏛 IEEE ⚖ 849 KB

[IEEE 2012 IEEE/CPMT 28th Semiconductor

[IEEE 2012 IEEE/CPMT 28th Semiconductor Thermal Measurement & Management Symposium (SEMI-THERM) - San Jose, CA, USA (2012.03.18-2012.03.22)] 2012 28th Annual IEEE Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - Test ASIC for investigation of thermal coupling in Many-Core Architectures

✍ Szermer, Michal; Maj, Cezary; Pietrzak, Piotr; Janicki, Marcin; Zajac, Piotr; Na 📂 Article 📅 2012 🏛 IEEE ⚖ 359 KB