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[IEEE 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - San Jose, CA, USA (7-9 Feb. 1995)] Proceedings of 1995 IEEE/CPMT 11th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM) - A method of the BJT transient thermal impedance measurement with double junction calibration

✍ Scribed by Zarebski, J.; Gorecki, K.

Book ID: 121489874
Publisher: IEEE
Year: 1995
Tongue: English
Weight: 229 KB
Category: Article
ISBN-13: 9780780324343
DOI: 10.1109/STHERM.1995.512055

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