✦ LIBER ✦

[IEEE 1995 IEEE International SOI Conference - Tucson, AZ, USA (3-5 Oct. 1995)] 1995 IEEE International SOI Conference Proceedings - Comparison of SOI MOSFET self-heating measurements by gate resistance thermometry and small-signal drain admittance extraction

✍ Scribed by Tenbroek, B.M.; Redman-White, W.; Lee, M.S.L.; Uren, M.J.

No coin nor oath required. For personal study only.

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