✦ LIBER ✦

[IEEE 1995 IEEE International SOI Conference - Tucson, AZ, USA (3-5 Oct. 1995)] 1995 IEEE International SOI Conference Proceedings - Comparison of plasma-induced charging damage in bulk and SOI MOSFETs

✍ Scribed by Sherony, M.J.; Chen, A.J.; Mistry, K.R.; Antoniadis, D.A.; Doyle, B.S.

No coin nor oath required. For personal study only.

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