✦ LIBER ✦

[IEEE 1995 IEEE International SOI Conference - Tucson, AZ, USA (3-5 Oct. 1995)] 1995 IEEE International SOI Conference Proceedings - Final polish for SOI wafers-surface roughness and TTV degradation

✍ Scribed by Pfeiffer, G.; Fetheroff, S.; Iyer, S.S.

No coin nor oath required. For personal study only.

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