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[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Enhanced EM endurance of TiN/AlCu/TiN/sub x/ interconnection

✍ Scribed by Jeong Soo Byun, ; Jun Ki Kim, ; Kwan Goo Rha, ; Woo Shik Kim,

Book ID: 126737676
Publisher: IEEE
Year: 1994
Weight: 77 KB
Category: Article
ISBN-13: 9780780319080
DOI: 10.1109/IRWS.1994.515844

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