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[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Circuit-level electrothermal simulation techniques for designing output protection devices

✍ Scribed by Ramaswamy, S.; Rosenbaum, E.; Sung-Mo Kang,

Book ID: 126650172
Publisher: IEEE
Year: 1994
Weight: 306 KB
Category: Article
ISBN-13: 9780780319080
DOI: 10.1109/IRWS.1994.515831

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