𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Gate oxide reliability: the use of simulation to quantify important aspects of lifetime projection from TDDB data

✍ Scribed by Hunter, W.R.

Book ID: 126735921
Publisher: IEEE
Year: 1994
Weight: 918 KB
Category: Article
ISBN-13: 9780780319080
DOI: 10.1109/IRWS.1994.515834

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 1994 IEEE International Integrated

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Implant damage evaluation using SPIDER

✍ Mitros, J.; Liu, J.; Chan, D. 📂 Article 📅 1994 🏛 IEEE ⚖ 109 KB

[IEEE 1994 IEEE International Integrated

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - JEDEC "TCR" interlaboratory experiment-lessons learned

✍ Schafft, H.A.; Suehle, J.S.; Albers, J. 📂 Article 📅 1994 🏛 IEEE ⚖ 879 KB

[IEEE 1994 IEEE International Integrated

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Production implementation of a practical WLR program

✍ Garrard, S. 📂 Article 📅 1994 🏛 IEEE ⚖ 748 KB

[IEEE 1994 IEEE International Integrated

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - The practical side of thin dielectric monitoring and characterization

✍ Suehle, J.S.; Messick, C.; Langley, B. 📂 Article 📅 1994 🏛 IEEE ⚖ 152 KB

[IEEE 1994 IEEE International Integrated

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Circuit-level electrothermal simulation techniques for designing output protection devices

✍ Ramaswamy, S.; Rosenbaum, E.; Sung-Mo Kang, 📂 Article 📅 1994 🏛 IEEE ⚖ 306 KB

[IEEE 1994 IEEE International Integrated

[IEEE 1994 IEEE International Integrated Reliability Workshop (IRWS) - Lake Tahoe, CA, USA (16-19 Oct. 1994)] Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) - Enhanced EM endurance of TiN/AlCu/TiN/sub x/ interconnection

✍ Jeong Soo Byun, ; Jun Ki Kim, ; Kwan Goo Rha, ; Woo Shik Kim, 📂 Article 📅 1994 🏛 IEEE ⚖ 77 KB