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[IEEE 1973 IEEE International Solid-State Circuits Conference - Philadelphia, PA, USA (1973.02.14-1973.02.16)] 1973 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Characterization of charge-coupled device line and area-array imaging at low light levels

✍ Scribed by White, M.; Lampe, D.; Mack, I.; Blaha, F.

Book ID: 118734707
Publisher: IEEE
Year: 1973
Weight: 819 KB
Category: Article
DOI: 10.1109/ISSCC.1973.1155159

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