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[IEEE 1976 IEEE International Solid-State Circuits Conference - Philadelphia, PA, USA (1976.02.18-1976.02.20)] 1976 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - Microwave GaAs FETs: Reliability and reproducibility

✍ Scribed by Cohen, E.

Book ID: 118059697
Publisher: IEEE
Year: 1976
Weight: 133 KB
Volume: 0
Category: Article
DOI: 10.1109/isscc.1976.1155550

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