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[IEEE 17th IEEE International Conference on Micro Electro Mechanical Systems. Maastricht MEMS 2004 Technical Digest - Maastricht, Netherlands (25-29 Jan. 2004)] 17th IEEE International Conference on Micro Electro Mechanical Systems. Maastricht MEMS 2004 Technical Digest - High signal to noise ratio in low field NMR on chip, simulations and experimental results

✍ Scribed by Wensink, H.; Hermes, D.C.; van den Berg, A.

Book ID: 126694430
Publisher: IEEE
Year: 2004
Tongue: English
Weight: 336 KB
Category: Article
ISBN-13: 9780780382657
DOI: 10.1109/MEMS.2004.1290608

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