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[IEEE 15th Biennial University/Government/Industry Microelectronics Symposium - Boise, ID, USA (30 June-2 July 2003)] Proceedings of the 15th Biennial University/Government/ Industry Microelectronics Symposium (Cat. No.03CH37488) - Development of a new technique for DNA single base pair mismatch analysis

✍ Scribed by Cibuzar, G.; Fisher, M.; Williamson, F.; Blumenfeld, M.; Suntharalingam, P.; Grenz, J.R.; Van ness, G.; Kyoug Joon Kim, ; Bar-Cohen, A.; Eccleston, E.

Book ID: 126678460
Publisher: IEEE
Year: 2003
Weight: 670 KB
Category: Article
ISBN-13: 9780780379725
DOI: 10.1109/UGIM.2003.1225723

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