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[IEEE 14th International Symposium on Power Semiconductor Devices and ICs - Sante Fe, NM, USA (4-7 June 2002)] Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics - Active pull-down protection for full substrate current isolation in smart power IC's

✍ Scribed by Laine, J.P.; Gonnard, O.; Charitat, G.; Bertolini, L.; Peyre-Lavigne, A.

Book ID: 118162495
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 469 KB
Volume: 0
Category: Article
ISBN-13: 9780780373181
DOI: 10.1109/ispsd.2002.1016224

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