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Identification of gate electrode discontinuities in submicron CMOS technologies, and effect on circuit performance

โœ Scribed by Jenkins, K.A.; Burghartz, J.N.; Agnello, P.D.


Book ID
114536461
Publisher
IEEE
Year
1996
Tongue
English
Weight
928 KB
Volume
43
Category
Article
ISSN
0018-9383

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