Impact of Self-Heating Effect on Long-Term Reliability and Performance Degradation in CMOS Circuits

✍ Scribed by Semenov, O.; Vassighi, A.; Sachdev, M.

• Book ID: 126486735
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 814 KB
• Volume: 6
• Category: Article
• ISSN: 1530-4388
• DOI: 10.1109/TDMR.2006.870340