✦ LIBER ✦

Huffman encoding of test sets for sequential circuits

✍ Scribed by Iyengar, V.; Chakrabarty, K.; Murray, B.T.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Encoding of Asynchronous Sequential Circ

✍ Hazeltine, Barrett 📂 Article 📅 1965 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 680 KB

Test compaction for sequential circuits

✍ Niermann, T.M.; Roy, R.K.; Patel, J.H.; Abraham, J.A. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 766 KB

Test Set and Fault Partitioning Techniqu

✍ Michael S. Hsiao; Srimat Chakradhar 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 74 KB

A test generation program for sequential

✍ Enrico Macii; Angelo R. Meo 📂 Article 📅 1994 🏛 Springer US 🌐 English ⚖ 349 KB

Sequential tests for integrated-circuit

✍ Chandramouli, R.; Vijaykrishnan, N.; Ranganathan, N. 📂 Article 📅 1998 🏛 IEEE 🌐 English ⚖ 678 KB

The pseudoexhaustive test of sequential

✍ Wunderlich, H.-J.; Hellebrand, S. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 812 KB