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Hot electrons in MOS transistors: Lateral distribution of the trapped oxide charge

✍ Scribed by C. Lombardi; P. Olivo; B. Ricco; E. Sangiorgi; M. Vanzi

Book ID: 126696898
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 325 KB
Volume: 3
Category: Article
ISSN: 0741-3106
DOI: 10.1109/EDL.1982.25543

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