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Hot-electron transport through Au/GaAs and Au/GaAs/AlAs heterojunction interfaces: Ballistic-electron-emission-microscopy measurement and Monte Carlo simulation

✍ Scribed by Ke, Mao-long; Westwood, D. I.; Matthai, C. C.; Richardson, B. E.; Williams, R. H.

No coin nor oath required. For personal study only.

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