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Comparison of Au contacts to Si, GaAs, InxGa1 − xP, and ZnSe measured by ballistic electron emission microscopy

✍ Scribed by B.A. Morgan; A.A. Talin; W.G. Bi; K.L. Kavanagh; R.S. Williams; C.W. Tu; T. Yasuda; T. Yasui; Y. Segawa


Book ID
114194132
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
617 KB
Volume
46
Category
Article
ISSN
0254-0584

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