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Hot hole transport through Au/n-Si(100) studied by reverse ballistic electron emission microscopy and spectroscopy

✍ Scribed by A. Chahboun; R. Coratger; R. Pechou; F. Ajustron; J. Beauvillain


Book ID
117214966
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
401 KB
Volume
462
Category
Article
ISSN
0039-6028

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