Hot-carrier stressing of NPN polysilicon emitter bipolar transistors incorporating fluorine

✍ Scribed by Sheng, S.R.; McKinnon, W.R.; McAlister, S.P.; Storey, C.; Hamel, J.S.; Ashburn, P.

• Book ID: 114617073
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 362 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2003.812502