✦ LIBER ✦
Hot-carrier degradation and oxide charge build-up in self-aligned etched-polysilicon npn bipolar transistors
✍ Scribed by Neviani, A.; Pavan, P.; Nardi, A.; Chantre, A.; Vendrame, L.; Zanoni, E.
- Book ID
- 114537057
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 124 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9383
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