Hot-carrier effects and lifetime prediction in off-state operation of deep submicron SOI N-MOSFETs

✍ Scribed by Shing-Hwa Renn; Rauly, E.; Pelloie, J.-L.; Balestra, F.

• Book ID: 114537276
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 244 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.669572