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Suppression of parasitic bipolar effects and off-state leakage in fully-depleted SOI n-MOSFET's using Ge-implantation
✍ Scribed by Hua-Fang Wei; Chung, J.E.; Kalkhoran, N.M.; Namavar, F.
- Book ID
- 114536375
- Publisher
- IEEE
- Year
- 1995
- Tongue
- English
- Weight
- 909 KB
- Volume
- 42
- Category
- Article
- ISSN
- 0018-9383
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