𝔖 Bobbio Scriptorium
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Hot carrier degradation in n-MOSFETs used as pass transistors

✍ Scribed by Mistry, K.; Doyle, B.


Book ID
114536983
Publisher
IEEE
Year
1990
Tongue
English
Weight
228 KB
Volume
37
Category
Article
ISSN
0018-9383

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