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Hole-traps in silicon dioxides. Part II. Generation mechanism

✍ Scribed by Zhao, C.Z.; Zhang, J.F.; Groeseneken, G.; Degraeve, R.


Book ID
114617505
Publisher
IEEE
Year
2004
Tongue
English
Weight
366 KB
Volume
51
Category
Article
ISSN
0018-9383

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