๐”– Bobbio Scriptorium
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Hole traps in silicon dioxides. Part I. Properties

โœ Scribed by Zhang, J.F.; Zhao, C.Z.; Chen, A.H.; Groeseneken, G.; Degraeve, R.


Book ID
114617504
Publisher
IEEE
Year
2004
Tongue
English
Weight
376 KB
Volume
51
Category
Article
ISSN
0018-9383

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