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Hole confinement in a Si/GeSi/Si quantum well on SIMOX

✍ Scribed by Nayak, D.K.; Woo, J.C.S.; Park, J.S.; Wang, K.L.; MacWilliams, K.P.

Book ID: 114536367
Publisher: IEEE
Year: 1996
Tongue: English
Weight: 331 KB
Volume: 43
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.477614

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