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Highly sensitive resist material for deep X-ray lithography

✍ Scribed by R. Schenk; O. Halle; K. Müllen; W. Ehrfeld; M. Schmidt


Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
280 KB
Volume
35
Category
Article
ISSN
0167-9317

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Electron-beam lithography resist profile
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A very highly sensitive resist is difficult to simulate its resist profile because of its extreme difference of development rate which can be determined from absorbed energy when electron beam is exposed. We developed resist profile simulator named ELlS (Electron-beam Lithography Simulator) that can